|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||I-3: Correlative Microscopy in Materials Science
||Will Harris, Jeff Gelb, Tobias Volkenandt, Leah Lavery
|On-Site Speaker (Planned)
In characterizing the microstructure and evolution of a material, it may be necessary to capture features across a range of length scales. Unfortunately, no single instrument exists that can address this “multi-scale challenge” and, furthermore, that is capable of coupling studies of microstructure evolution with multi-scale resolution. For this reason, many researchers are turning toward correlative microscopy workflows, where instruments such as SEMs and XRMs can be used alongside in situ devices to map changes in microstructure, identifying smaller regions for targeted analysis with FIB-SEM.
In this presentation, we will both introduce the motivations for correlative microscopy and discuss recent progress in the development of correlative characterization workflows. We will present the development of an open framework, in which multi-dimensional data may be used in an integrated manner, enabling hierarchical studies across length scales and facilitating collaborative routines amongst researchers at geographically disparate locations.
||Planned: Supplemental Proceedings volume