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Meeting Materials Science & Technology 2020
Symposium Materials Informatics for Images and Multi-dimensional Datasets
Presentation Title FAIR Digital Object Framework and High Throughput Experiment
Author(s) Zachary Trautt, Raymond L Plante, Gretchen R Greene, Jason R. Hattrick-Simpers, Brian L. DeCost, Aaron G. Kusne, Andriy Zakutayev
On-Site Speaker (Planned) Zachary Trautt
Abstract Scope With the increasing use of data-driven methodologies, concerns around data discovery, data access, and data interoperability have come to the forefront. Beginning in August 2019, communities have convened to work towards convergence of three complementary visions: (1) Digital Object Architecture, (2) Linked Data and Semantic Web, (3) FAIR Data Principles. This convergence has established the FAIR Digital Object Framework. This talk will overview these developments, summarize work within the NIST Material Measurement Laboratory to support adoption of the FAIR Digital Object Framework within the materials science and engineering community, and provide practical examples of how researchers can leverage these developments.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Accelerate TEM and Tomography Imaging by Deep-learning Enabled Compressive Sensing and Information Inpainting in High-dimensional Manifold
Assessment of the Ability of Laboratory Accelerated Corrosion Tests to Accurately Predict On-road Corrosion of 6xxx Al Alloys
Automated Optical Microscopy for Rapid Defect Screening
Computer Vision and Machine Learning for Microstructural Image Data
Developing Granular Dielectrics Based on Reconstructed Micro-CT Images
FAIR Digital Object Framework and High Throughput Experiment
Feature Characterization of Electron Backscatter Patterns from Rotating Lattice Single Crystals Using Machine Learning
Identifying Crack Initiation Sites with CNNs
Incorporating Materials Physics into Imaging Algorithms for Microscope Image Interpretation
Introductory Comments: Materials Informatics for Images and Multi-dimensional Datasets
Keyhole Porosity Threshold in Laser Melting Revealed by High-Speed X-ray Imaging
Microstructure Representation for Physically Meaningful Descriptors
Neural Networks and Community Driven Software for Scanning Transmission Electron Microscopy
Towards Smart Categorization of Growth Morphology by Machine Learning

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