|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||Atomic-scale Characterization of Boron Carbide with Advanced TEM and Atom Probe Techniques
||Kelvin Xie, Paul Rottmann, Luoning Ma, Kevin J. Hemker
|On-Site Speaker (Planned)
Boron carbide is an attractive engineering material due to its low density and superior hardness, making it a suitable material for many engineering applications. However, many fundamental aspects of boron carbide still remain elusive (e.g. atomic occupancy, relative building block stability, quasi-plasticity, etc.). In this work, we employed the state-of-art characterization techniques (i.e. atom probe tomography, precession assisted crystal orientation mapping (PACOM) and nano-scale strain mapping) to address the aforementioned challenges. In addition, the roles of planar defects and Si-alloying on boron carbide structural stability and quasi-plasticity will be discussed. The new insights we have gained here can guide the design of tougher boron carbide via atomic-level understanding and engineering.
||Planned: Supplemental Proceedings volume