|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Dynamic Behavior of Materials VIII
||Shear Response of High-purity Tantalum during Quasi-static and Dynamic Loading
||Thomas Nizolek, James A Valdez, Cheng Liu, George T Gray
|On-Site Speaker (Planned)
The shear response of high-purity tantalum is of interest for assessing the propensity for shear localization/fragmentation during dynamic loading and for providing constitutive data needed to model such events. Here we present a new compact shear specimen where localized in-plane shear deformation in the gauge section is driven by far-field compressive loading. While motivated by the compact forced shear specimen design of Gray, Vecchio, and Livescu (Acta. Mater. 2016), the new specimen geometry enables in situ strain mapping using digital image correlation. The use of this specimen to explore the effects of temperature and strain rate on the shear response of high-purity tantalum will be discussed, with particular emphasis on the extent of shear location and microstructural evolution within the shear zone.
||Planned: Supplemental Proceedings volume