| About this Abstract |
| Meeting |
2016 TMS Annual Meeting & Exhibition
|
| Symposium
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Accelerated Materials Evaluation for Nuclear Application Utilizing Test Reactors, Ion Beam Facilities and Integrated Modeling
|
| Presentation Title |
Y-4: Grain Boundary Character Effect on Radiation Induced Defect Distribution in Nanocrystalline Nickel and Nickel-Chromium Thin Films |
| Author(s) |
James Nathaniel, Osman El-Atwani, Asher Leff, Mitra L. Taheri, Jon Kevin Baldwin, Khalid Hattar |
| On-Site Speaker (Planned) |
James Nathaniel |
| Abstract Scope |
Radiation damage is driven by the formation, diffusion, and agglomeration of point defects caused by the high-energy particles impinging on the microstructure. Point defects can migrate leading to segregation or forming voids or loops. One approach to microstructural design is producing alloys with an increased density of grain boundaries (GB) and specific GB types; an intricate microstructure that facilitates the recombination/annihilation of point defects at GBs. In this study, an experimental evaluation compares how GB character affects irradiation-induced damage in nanocrystalline Ni and Ni-5%Cr thin films. The films possess grains from 15 nm to 200 nm, and microstructures with a variety of GB types (high angle and low angle grain boundaries; CSL and twin boundaries). Samples were irradiated to 1, 2, and 5 dpa at 400ºC with Ni ions and characterized using TEM and procession orientation mapping. This work provides insight into damage mitigation properties in nanocrystalline austenitic materials. |
| Proceedings Inclusion? |
Planned: A print-only volume |