|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Pan American Materials Congress: Nanocrystalline and Ultra-fine Grain Materials and Bulk Metallic Glasses
||A High Resolution X-ray Diffraction Line Profile Analysis of Mg-Ce and Mg-Nd Alloys after HPT Processing
||Hiba Azzeddine, Yousf Islem Bourezg, Zdeneck Matej, Yi Huang, Djamel Bradai, Terence G. Langdon
|On-Site Speaker (Planned)
The particle size, size distribution and dislocation density were determined in ultrafine-grained Mg-1.44Ce (wt.%) and Mg-1.43Nd (wt.%) alloys processed by high-pressure torsion at ambient temperature using high resolution X-ray diffraction line profile analysis (XRDLPA). The alloy samples were processed up to 1 and 10 turns and the X-ray line profile measurements were carried out in the reflection geometry with scanning 2D detector in the X-ray powder diffraction beamline 711 of the MAXLab Synchrotron in Lund, Sweden. In order to check any microstructure parameters gradient along the radius of the HPT discs, each sample was measured at 5 points in a line with distances from the center. Software for microstructure analysis from X-ray powder diffraction based on total pattern fitting and modelling (MStruct) was used. The results from XRDLPA were correlated to microhardness measurements at these selected positions and there was good agreement.
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