| About this Abstract |
| Meeting |
Materials Science & Technology 2012
|
| Symposium
|
MS&T'12 Poster Session
|
| Presentation Title |
The Constrained Sintering Stress Evolution of Doped Ceria Thick Films |
| Author(s) |
Qing Yang, Jason D. Nicholas |
| On-Site Speaker (Planned) |
Qing Yang |
| Abstract Scope |
The stress evolution of Ce<SUB>0.9</SUB>Gd<SUB>0.1</SUB>O<SUB>1.95</SUB> (CGO) thick films during constrained sintering was measured using a Multibeam Optical Stress Sensor (MOSS). Unconstrained film dilatometry was used to confirm the dominant sintering mechanisms of freely sintered CGO. Quantitative analysis of three-dimensional Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) microstructural reconstructions was used to identify the dominant sintering mechanisms in constrained and unconstrained samples. The observed density, particle morphology, and inter-particle contact area evolution was correlated with the observed stress behavior. |
| Proceedings Inclusion? |
Definite: A CD-only volume |