|About this Abstract
||Materials Science & Technology 2012
||MS&T'12 Poster Session
||The Constrained Sintering Stress Evolution of Doped Ceria Thick Films
||Qing Yang, Jason D. Nicholas
|On-Site Speaker (Planned)
The stress evolution of Ce<SUB>0.9</SUB>Gd<SUB>0.1</SUB>O<SUB>1.95</SUB> (CGO) thick films during constrained sintering was measured using a Multibeam Optical Stress Sensor (MOSS). Unconstrained film dilatometry was used to confirm the dominant sintering mechanisms of freely sintered CGO. Quantitative analysis of three-dimensional Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) microstructural reconstructions was used to identify the dominant sintering mechanisms in constrained and unconstrained samples. The observed density, particle morphology, and inter-particle contact area evolution was correlated with the observed stress behavior.
||Definite: A CD-only volume