X-ray phase and dark-field imaging techniques provide important supplementary and inaccessible information compared to X-ray absorption imaging. Recently, X-ray speckle-based technique has shown great potential for retrieving X-ray absorption, phase and dark-field images simultaneously by using a simple experimental arrangement1, 2. Importantly, the technique has also been extended from a synchrotron light source to a lab-based microfocus X-ray source3. X-ray phase and dark-field tomography can reveal subtle details and distinctive features of the internal structure of a sample4. Details of the technique and representative examples of applications in both biomedical applications and material science will be presented. 1.H. Wang, Y. Kashyap, et al, Phys. Rev. Lett. 114, 103901 (2015). 2.H. Wang, S. Berujon, et al, Scientific Reports 5, 8762 (2015). 3.H. Wang, Y. Kashyap, et al, Scientific Reports 6, 20476 (2016). 4.H. Wang, Y. Kashyap, et al, Appl. Phys. Lett. 108, 154105 (2016).