|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Alloys and Compounds for Thermoelectric and Solar Cell Applications V
||Combinatorial Approach in Thermoelectric Materials Research
||Winnie Wong-Ng, Yonggao Yan, Joshua Martin, Makoto Otani, Sara Barron, Nam Nguyen, Evan Thomas, Kevin Talley, Martin Green
|On-Site Speaker (Planned)
At the National Institute of Standards and Technology (NIST), we have developed a combinatorial film deposition facility and a suite of high throughput instrumentation to perform combinatorial characterization of higher efficiency thermoelectric materials. These capabilities include a Pulsed Laser Deposition (PLD) apparatus for combinatorial thin film synthesis, an X-ray diffractometer for phase characterization, and a suite of tools for screening functional properties such as the Seebeck coefficient, electrical resistance, and thermal effusivity of combinatorial films. The local Seebeck coefficient and resistance are measured via custom-built automated apparatus at and above room temperatures. Thermal effusivity is measured using a frequency domain thermoreflectance technique. Our talk will discuss the applications using these tools to investigate thermoelectric materials, including combinatorial composition-spread films of various systems, and also conventional films, single crystals and other bulk materials.
||Planned: Supplemental Proceedings volume