|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||LL-61: 5-Parameter Grain Boundary Measurement from a Single 2-Dimensional EBSD Scan
||Michael Chapman, Marc DeGraef
|On-Site Speaker (Planned)
The determination of the crystallographic orientation near a grain boundary is difficult with EBSD because the pattern tends to be a mix of the Kikuchi bands from the grains on either side of the boundary. This presentation will show how these overlapping patterns can be utilized by determining the fraction of the pattern from each grain and how this fraction changes while scanning across the boundary. From this rate of change, the in-plane grain boundary inclination angle can be calculated. With the inclination angle and the orientation of each grain known, the full 5-parameter grain boundary characteristic can be calculated. The overlap patterns will be matched to results from Monte Carlo simulations, and the calculations will also be verified by trenching the grain boundaries on a FIB to measure the actual grain boundary inclination angle.
||Planned: A print-only volume