|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Dark Field X-Ray Microscopy for Studies of Very Low Angle Boundaries
||Sonja Rosenlund Ahl, Hugh Simons, Anders Clemen Jakobsen, Frederik Stöhr, Yubin Zhang, Wolfgang Pantleon, Dorte Juul Jensen, Henning Friis Poulsen
|On-Site Speaker (Planned)
||Sonja Rosenlund Ahl
We present the recently developed technique of Dark Field X-Ray Microscopy , that enables fast, non-destructive determination of the structure of (sub)micrometre grains or subgrains embedded in millimetre-sized samples. The technique utilizes the diffraction of hard X-rays from individual grains and by magnifying the diffracted signal through a compound X-ray lens a 3D orientational map in direct space can be constructed with angular resolution of 0.005 degrees and spatial resolution of 200 nm. Furthermore, fast measurements are possible using high-brilliance synchrotron X-ray sources and thereby structural changes induced by annealing or other external influences may be monitored in situ.
The capabilities of Dark Field X-Ray Microscopy are illustrated by examples from a study of very low-angle boundaries (<0.1 degrees) observed within a recrystallizing grain embedded in a partly recrystallized sample of 50% cold-rolled aluminium Al1050.
 H. Simons et al, Nature Comm. 6 (2015) 6098.
||Planned: EPD Congress Volume