|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||An In Situ Load Stage to Combine 3D X-ray Tomography with Nanomechanical Testing
||William Harris, Benjamin Hornberger, Arno Merkle, Hrishikesh Bale, Leah Lavery, Roberty Bradley, Xuekun Lu, Philip J. Withers, Nikolaus Cordes, Brian Patterson
|On-Site Speaker (Planned)
Recently, lab-based nanoscale X-ray microscopy (XRM) has moved beyond the limits of traditional MicroCT by incorporating synchrotron-style components, extending spatial resolution to 50 nm, complementing MicroCT and filling a portion of the span between sub-nanometer and bulk 3D imaging. To leverage this new scale of investigation, and complement established in situ methods implemented in MicroCT, optical, and electron microscopy, a new in situ load stage has been designed and tested in a nanoscale XRM. The device applies tension, compression, and nanoindentation loading modes to samples tens to hundreds of microns in size, with the intent of connecting bulk material properties with detailed observations of internal, 3D deformation events occurring at the nano- and micron-scale. This work covers early applications of the technique, including crack development in dentin and critical fracture events in single crystal particles used in explosives applications. An outlook for future nanoscale tomography will also be discussed.
||Planned: A print-only volume