|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Ultrafine-grained Materials X
||Thermally Induced Grain Coarsening in Alpha Iron
||Yu-Feng Shen, S. Maddali, David Menasche, Aditi Bhattacharya, G. S. Rohrer, R. M. Suter
|On-Site Speaker (Planned)
Near-field High Energy x-ray Diffraction Microscopy (nf-HEDM), a synchrotron-based, non-destructive, 3-D characterization technique, was used to track microstructural evolution in a sample of Iron under thermal annealing. The sample was cut out of a rolled and annealed piece of alpha-iron. After first scan, the sample was removed from its mount and annealed, and then remounted close to the pre-annealed configuration. We study the evolution of grain and grain boundary statistics using the grain morphology provided by nf-HEDM. Also, after matching the grains of two states, we track thousands of grains as they evolve, along with the movement of grain boundaries. This analysis can be used to help further develop models of thermally induced grain coarsening.
||Planned: Supplemental Proceedings volume