|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||In-Situ Femtosecond Laser Milling Technique for Microstructural Characterization
||Tomoko Sano, Jonathan Ligda
|On-Site Speaker (Planned)
The technique of using the femtosecond laser to mill away material for microstructural characterization has been developed. This rapid technique allows larger areas to be characterized in a much shorter time since the femtosecond laser milling rate is orders of magnitude faster than that of the ion beam. The femtosecond laser is introduced into the focused ion beam, through an objective lens connected to a micromanipulator. Scripts were written to automate the milling controls, image capture, and stage motion for secondary electron, electron backscattered diffraction, and energy dispersive spectroscopy characterization. With the femtosecond laser coupled to the focused ion beam, both 2D and serial sectioning for 3D volumetric characterization are possible. In this oral paper, this technique is described and the effect of the femtosecond laser parameters, including power, number of steps, and polarization is evaluated for both ceramics and lightweight alloys.
||Planned: Stand-alone book in which only your symposium’s papers would appear (indicate title in comments section below)